The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Jun. 15, 2012
Applicant:

Jan Hrastnik, Sandhausen, DE;

Inventor:

Jan Hrastnik, Sandhausen, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3672 (2013.01); G06F 11/3447 (2013.01); G06F 11/3684 (2013.01);
Abstract

Methods and apparatus, including computer program products, are provided for testing data structures, such as for example business objects. In some implementations, there is provided a method. The method may include generating, at a test system, a test script including a test business object generated based on metadata describing aspects of a deployed business object at a target system; receiving, at the test system, a request to test the target system including the deployed business object; testing, based on the generated test script including the test business object, at least one of a data and an action of the deployed business object; and generating, at the test system, at least a result of the testing. Related systems, methods, and articles of manufacture are also disclosed.


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