The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Mar. 13, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Harini Kantareddy, Hyderabad, IN;

Ravirajan Rajan, Apex, NC (US);

Arun Ramakrishnan, Tamil Nadu, IN;

Rohit Shetty, Bangalore, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06Q 10/00 (2012.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0766 (2013.01); G06F 11/0709 (2013.01); G06F 11/0754 (2013.01); G06Q 10/00 (2013.01); H04L 41/046 (2013.01); H04L 41/0695 (2013.01); H04L 41/142 (2013.01); H04L 41/069 (2013.01);
Abstract

A mechanism is provided for identifying failed components during data collection. For each data source combination in a plurality of data sources, a determination is made as to whether a standard deviation (σ) for an estimated collection interval of the data source is above a predetermined standard deviation threshold (σ). Responsive to the standard deviation (σ) for the estimated collection interval of the data source being above the predetermined standard deviation threshold (σ), an error signal is generated indicating an error in data collection with the data source.


Find Patent Forward Citations

Loading…