The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Sep. 25, 2013
Emc Corporation, Hopkinton, MA (US);
Ao Ma, Palo Alto, CA (US);
Windsor W. Hsu, San Jose, CA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Techniques for predicting multiple disk failures are described herein. According to one embodiment, first values of a predetermined diagnostic parameter collected from a set of known failed disks of a storage system are received. A quantile distribution graph of the first values against percentiles of a number of known failed disk is generated. In response to second values of the predetermined diagnostic parameter collected from a set of target disks, each of the second values is applied to the quantile distribution graph to determine a corresponding percentile for each of the target disks, which represents a failure probability of a corresponding one of the target disks. A failure probability of two or more of the target disks is calculated based on the determined percentiles of the target disks.