The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Apr. 25, 2013
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Haruyuki Tsuji, Ina, JP;

Masayoshi Karasawa, Nagano, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/04 (2006.01); G02B 21/02 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/04 (2013.01); G02B 21/0088 (2013.01); G02B 21/02 (2013.01); G02B 21/24 (2013.01);
Abstract

An inverted microscope that allows observation of a specimen from underneath includes an objective lens holding unit that holds an objective lens configured to collect at least observation light from the specimen, a tube lens configured to focus the observation light collected by the objective lens, a branching unit configured to branch an optical path of the observation light from the tube lens, and an observation image switching device that is removably provided in a microscope main body between the objective lens and the tube lens and is configured to switch between wavelengths of an observation image or between magnifications of the observation image.


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