The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Nov. 14, 2008
Freddy Odille, Labaffe, FR;
Pierre-andré Vuissoz, Villers-les-Nancy, FR;
Jacques Felblinger, Merveille, FR;
Freddy Odille, Labaffe, FR;
Pierre-André Vuissoz, Villers-les-Nancy, FR;
Jacques Felblinger, Merveille, FR;
UNIVERSITE DE LORRAINE, Nancy, FR;
Abstract
A method for acquiring () experimental measures with interferences of a physical phenomenon, and for reconstructing () a point-by-point signal () representative of the phenomenon according to at least one dimension that can vary during the experimental measure acquisition, using at least one simulation model () of at least one acquisition chain of the experimental measures including at least one interference, and at least one model () of each interference in each acquisition chain, each interference model being determined at least from the measures themselves, wherein the simulation and interference models include adjustable parameters () depending on experimental conditions, wherein at least one adjustable parameter of one of the models is coupled to at least one adjustable parameter of the other model, and in that the adjustable parameters are optimized in a coupled manner. A device for MRI imaging, NMR, or medical imaging using such a method is described.