The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Dec. 22, 2010
SO Kitazawa, Mito, JP;
Naoyuki Kono, Mito, JP;
Atsushi Baba, Tokai, JP;
HITACHI-GE NUCLEAR ENERGY, LTD., Ibaraki, JP;
Abstract
An ultrasonic inspection method and an ultrasonic inspection device allow three-dimensional inspection data and three-dimensional shape data to be appropriately positioned on a display screen and allow a defect echo and a shape echo to be quickly identified even when information on the relative positions of a probe and an object to be inspected is not provided. The ultrasonic inspection data that is generated from the waveforms of ultrasonic waves received by an ultrasonic probe is compared with a plurality of ultrasonic propagation data pieces calculated by a ray tracing method on the basis of the three-dimensional shape data on an object to be inspected. The position of the three-dimensional inspection data or the three-dimensional shape data is moved relative to the other data position on the basis of the comparison results, thereby displaying the three-dimensional inspection data and the three-dimensional shape data while overlapping each other.