The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Apr. 13, 2010
Micah P. Ledbetter, Oakland, CA (US);
Charles W. Crawford, Albuquerque, NM (US);
David E. Wemmer, Berkeley, CA (US);
Alexander Pines, Berkeley, CA (US);
Svenja Knappe, Boulder, CO (US);
John Kitching, Boulder, CO (US);
Dmitry Budker, El Cerrito, CA (US);
Micah P. Ledbetter, Oakland, CA (US);
Charles W. Crawford, Albuquerque, NM (US);
David E. Wemmer, Berkeley, CA (US);
Alexander Pines, Berkeley, CA (US);
Svenja Knappe, Boulder, CO (US);
John Kitching, Boulder, CO (US);
Dmitry Budker, El Cerrito, CA (US);
The Regents of the University of California, Oakland, CA (US);
The United States of America, as represented by the Secretary of Commerce, the National Institute of Standards and Technology, Washington, DC (US);
Abstract
An embodiment of a method of detecting a J-coupling includes providing a polarized analyte adjacent to a vapor cell of an atomic magnetometer; and measuring one or more J-coupling parameters using the atomic magnetometer. According to an embodiment, measuring the one or more J-coupling parameters includes detecting a magnetic field created by the polarized analyte as the magnetic field evolves under a J-coupling interaction.