The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Nov. 15, 2011
Applicants:

Benoit Merchez, Combaillaux, FR;

Didier Cremien, Juvignac, FR;

Alexandra Urankar, Saint Clement de Riviere, FR;

Inventors:

Benoit Merchez, Combaillaux, FR;

Didier Cremien, Juvignac, FR;

Alexandra Urankar, Saint Clement de Riviere, FR;

Assignee:

HORIBA ABX SAS, Montpellier cedex 4, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/47 (2006.01); G01N 15/14 (2006.01); G01N 21/51 (2006.01); G01N 21/64 (2006.01); G01N 27/04 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01N 15/147 (2013.01); G01N 15/1434 (2013.01); G01N 21/51 (2013.01); G01N 21/64 (2013.01); G01N 21/645 (2013.01); G01N 27/04 (2013.01); G01N 2015/1037 (2013.01);
Abstract

The invention relates to an electro-optical device for measurements of flow for the characterization of microparticles, comprising a measurement chamber (CUM) in which there circulates the flow of the fluid to be characterized, at least two luminous sources (S,S) of disjoint spectra, a device for measuring resistivity (RES), and at least three other detectors (D,D,D) each allowing the measurement of an optical parameter, the optical parameters being chosen from among fluorescence (FL), extinction (EXT), wide angle diffraction (SSC) and small angle diffraction (FSC).


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