The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Nov. 25, 2013
Furukawa Co., Ltd., Tokyo, JP;
Furukawa Industrial Machinery Systems Co., Ltd., Tokyo, JP;
Koji Tsukada, Tochigi, JP;
Fumio Yuasa, Ibaraki, JP;
Furukawa Co., Ltd., Tokyo, JP;
Furukawa Industrial Machinery Systems Co., Ltd., Tokyo, JP;
Abstract
A briquette inspection device and a briquette inspection method are capable of measuring at least a volume and a crush strength of an identical briquette sample. The briquette inspection deviceis provided with: a volume measuring unitfor measuring the volume of the briquette sample B by laser scanning; and a crush strength measuring unitfor measuring the crush strength of the briquette sample B by pressing down and crushing the briquette sample B after the volume measuring unit measures the volume of the briquette sample.