The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Jun. 04, 2012
Applicants:
Gary J. Van Berkel, Oak Ridge, TN (US);
Richard C. King, Quakertown, PA (US);
Inventors:
Gary J. Van Berkel, Oak Ridge, TN (US);
Richard C. King, Quakertown, PA (US);
Assignee:
UT-Battelle, LLC, Oak Ridge, TN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/38 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
G01N 1/38 (2013.01); G01N 2001/383 (2013.01); H01J 49/0404 (2013.01); H01J 49/0468 (2013.01);
Abstract
A method for performing surface sampling of an analyte, includes the step of placing the analyte on a stage with a material in molar excess to the analyte, such that analyte-analyte interactions are prevented and the analyte can be solubilized for further analysis. The material can be a matrix material that is mixed with the analyte. The material can be provided on a sample support. The analyte can then be contacted with a solvent to extract the analyte for further processing, such as by electrospray mass spectrometry.