The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Jan. 28, 2014
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Ian S. Robinson, Redondo Beach, CA (US);
John D. Bloomer, Redondo Beach, CA (US);
Assignee:
RAYTHEON COMPANY, Waltham, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01J 3/28 (2006.01); G01J 3/26 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/26 (2013.01); G01J 3/45 (2013.01);
Abstract
An imaging transform spectrometer, and method of operation thereof, that is dynamically configurable 'on demand' between an interferometric spectrometer function and a broadband spatial imaging function to allow a single instrument to capture both broadband spatial imagery and spectral data of a scene. In one example, the imaging transform spectrometer is configured such that the modulation used for interferometric imaging may be dynamically turned ON and OFF to select a desired mode of operation for the instrument.