The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Jan. 24, 2013
Applicants:

Andrew Schultz, Grosse Pointe Farms, MI (US);

Adam Blot, Schenectady, NY (US);

Matthew Marsh, Green Island, NY (US);

David Cassidy, Watervliet, NY (US);

Victor E. Nerses, Voorheesville, NY (US);

Inventors:

Andrew Schultz, Grosse Pointe Farms, MI (US);

Adam Blot, Schenectady, NY (US);

Matthew Marsh, Green Island, NY (US);

David Cassidy, Watervliet, NY (US);

Victor E. Nerses, Voorheesville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/00 (2006.01); G01K 1/00 (2006.01); F28F 27/00 (2006.01);
U.S. Cl.
CPC ...
F28F 27/00 (2013.01);
Abstract

A testing apparatus measures cooling power of an electrically-powered Microclimate Cooling Unit (MCU) at the point of use of the MCU. The tester includes fluid supply and return ports for fluidly connecting to the MCU. A fluid heater provides a heat load to fluid in the tester. Fluid temperatures upstream and downstream of the heater are measured. The fluid flow rate is adjustable and measurable. A digital processor extracts the temperature and fluid flow rate data and computes cooling watts. The computed cooling watts are compared to the manufacturer's specifications to determine if the MCU is operating properly.


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