The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Apr. 23, 2014
Applicant:

Ajou University Industry-academic Cooperation Foundation, Suwon, Gyeonggi-Do, KR;

Inventors:

Chang-Koo Kim, Seoul, KR;

Sung-Woon Cho, Gyeonggi-Do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); C23F 1/12 (2006.01); B22F 1/00 (2006.01); C23C 18/16 (2006.01); C23C 18/18 (2006.01); C23C 18/40 (2006.01); H01L 21/288 (2006.01); C23F 4/00 (2006.01);
U.S. Cl.
CPC ...
C23F 1/12 (2013.01); B22F 1/0044 (2013.01); C23C 18/1605 (2013.01); C23C 18/1657 (2013.01); C23C 18/1893 (2013.01); C23C 18/405 (2013.01); C23F 4/00 (2013.01); H01L 21/288 (2013.01); B22F 2304/05 (2013.01); H01J 2237/0203 (2013.01); H01J 2237/3341 (2013.01);
Abstract

This invention relates to a method of fabricating a three-dimensional copper nanostructure, including manufacturing a specimen configured to include a SiOmask; performing multi-directional slanted plasma etching to form a three-dimensional etching structure layer on the specimen; performing plating so that a multi-directional slanted plasma etched portion of the specimen is filled with a metal; removing an over-plated portion and the SiOmask from the metal layer; and removing a portion of a surface of the specimen other than the metal which is the three-dimensional etching structure layer. In this invention, a uniform copper nanostructure array can be obtained by subjecting a large-area specimen disposed in a Faraday cage to multi-directional slanted plasma etching using high-density plasma, forming a copper film on the etched portion of the specimen, and removing an over-plated copper film and the SiOmask, and the diameter of the copper nanostructure can be arbitrarily adjusted, thus attaining high applicability.


Find Patent Forward Citations

Kim, Chang-Koo. (2015). Three-dimensional copper nanostructure and fabrication method thereof (U.S. Patent No. 9139914). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9139914

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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