The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

May. 22, 2012
Applicants:

Ulrich Schotten, AAchen, DE;

Stef Zeemering, Maastricht, NL;

Bart Maesen, Riemst, BE;

Inventors:

Ulrich Schotten, AAchen, DE;

Stef Zeemering, Maastricht, NL;

Bart Maesen, Riemst, BE;

Assignee:

Maastricht University, Maastricht, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/046 (2006.01); A61B 5/0452 (2006.01); A61B 5/04 (2006.01); A61B 5/00 (2006.01); A61N 1/362 (2006.01);
U.S. Cl.
CPC ...
A61B 5/046 (2013.01); A61B 5/04012 (2013.01); A61B 5/04525 (2013.01); A61B 5/7275 (2013.01); A61N 1/3624 (2013.01);
Abstract

The invention relates to a computer-implemented method for determining an AF complexity value. The method includes applying a template matching algorithm to an ECG signal to obtain a set of candidate deflections and identifying intrinsic deflections within the set of candidate deflections. The method further includes determining a number of intrinsic deflections and a number of far-field deflections within the set of candidate deflections, based on the identified intrinsic deflections, and determining the AF complexity value as a ratio between the number of far-field deflections and the number of intrinsic deflections.


Find Patent Forward Citations

Loading…