The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Jan. 28, 2014
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Yongsheng Shi, San Diego, CA (US);

Aditya Gautam, Hyderabad, IN;

Nilotpal Dhar, Hyderabad, IN;

Liangchi Hsu, San Diego, CA (US);

Arvindhan Kumar, San Diego, CA (US);

Chetan Gopalakrishnan Chakravarthy, San Diego, CA (US);

Luna Sapna D'Souza, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04W 24/10 (2009.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 24/10 (2013.01); H04W 36/0088 (2013.01);
Abstract

Disclosed are systems and methods for continuous inter-frequency measurement reconfigurations in a DC-HSUPA User Equipment (UE). In one aspect, the system may configure the UE to perform intra-frequency measurements on a frequency f1 and inter-frequency measurements on a frequency f2 in a dual carrier (DC) downlink (DL) mode and a single carrier (SC) uplink (UL) mode. The system may then reconfigure the UE to operate in a DC UL mode and continuing to perform inter-frequency measurements on the frequency f2 in the DC UL mode. The system may then reconfigure the UE to operate in the SC UL mode and continuing to perform inter-frequency measurements on frequency f2 in the SC UL mode.


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