The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Aug. 14, 2012
Applicants:
Eun-hwa Kim, Seoul, KR;
Jin-woong Jeong, Seoul, KR;
Young-jae Kim, Seoul, KR;
Chol-ho Kwak, Seoul, KR;
Seul-yi Soh, Langley, CA;
Myung-jin Soh, Langley, CA;
Inventors:
Eun-Hwa Kim, Seoul, KR;
Jin-Woong Jeong, Seoul, KR;
Young-Jae Kim, Seoul, KR;
Chol-Ho Kwak, Seoul, KR;
Seul-Yi Soh, Langley, CA;
Myung-Jin Soh, Langley, CA;
Assignee:
Luxen Technologies, Inc., Seoul, KR;
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/378 (2013.01);
Abstract
Embodiments of the present invention provide an approach for improving overall chip speed by providing one or more sampling circuits in an ROIC so that signal processing and signal reading out operations may occur simultaneously instead of successively.