The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Mar. 15, 2013
Electronics and Telecommunications Research Institute, Daejeon-si, KR;
Han-Hyub Lee, Daejeon-si, KR;
Seung-Il Myong, Daejeon-si, KR;
Eui-Suk Jung, Daejeon-si, KR;
Sang-Soo Lee, Daejeon-si, KR;
Electronics and Telecommunications Research Institute, Daejeon-si, KR;
Abstract
An optical layer monitoring apparatus and method thereof are provided. According to an embodiment of the present invention, an optical layer monitoring apparatus including an optical time domain reflectometer (OTDR) function so as to monitor an optical path of a passive optical network (PON), and a method for improving accuracy of measured monitoring results using the optical layer monitoring apparatus are provided. Therefore, it is possible to enable a user to continuously detect distortion or attenuation along the optical path, and to quickly recover from the distortion or attenuation along the optical path when distortion or attenuation is detected.