The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Mar. 21, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Jungwon Lee, San Diego, CA (US);

Jiwoong Choi, Sunnyvale, CA (US);

Yakun Sun, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 1/04 (2006.01); H04B 1/10 (2006.01);
U.S. Cl.
CPC ...
H04B 1/10 (2013.01);
Abstract

Systems, methods, and other embodiments associated with signal detection with an adjustable number of interfering signals. According to one embodiment an apparatus includes an interferer counter, a detection method selector, and a signal detector. The interferer counter is configured to identify a number of active interfering signals in a received signal. The detection method selector is configured to select a signal detection method based, at least in part, on the number of active interfering signals identified by the interferer counter. In this manner, when one interfering signal is identified, a detection method having a first order is selected; and when two interfering signals are identified, the detection method having a second order is selected. The signal detector is configured to process the received signal according to the signal detection method selected by the detection method selector to detect an intended signal in the received signal.


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