The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Feb. 20, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Hongzhi Zhao, San Jose, CA (US);

Xiaohan Chen, Sunnyvale, CA (US);

Zigang Yang, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04K 1/02 (2006.01); H04B 1/04 (2006.01);
U.S. Cl.
CPC ...
H04B 1/0475 (2013.01);
Abstract

Example embodiment of the systems and methods of linear impairment modeling to improve digital pre-distortion adaptation performance includes a DPD module that is modified during each sample by a DPD adaptation engine. A linear impairment modeling module separates the linear and non-linear errors introduced in the power amplifier. The linear impairment model is adjusted during each sample using inputs from the input signal and from a FB post processing module. The linear impairment modeling module removes the linear errors such that the DPD adaptation engine only adapts the DPD module based on the non-linear errors. This increases system stability and allows for the correction of IQ imbalance inside the linear impairment modeling, simplifying the feedback post-processing.


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