The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Aug. 20, 2013
Applicant:

Sandisk Enterprise Ip Llc, Milpitas, CA (US);

Inventors:

Xiaoheng Chen, San Jose, CA (US);

Jiangli Zhu, Sunnyvale, CA (US);

Ying Yu Tai, Mountain View, CA (US);

Assignee:

SANDISK ENTERPRISE IP LLC, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); H03M 13/29 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1137 (2013.01); H03M 13/2909 (2013.01);
Abstract

The various implementations described herein include systems, methods and/or devices for enhancing the performance of error control decoding. The method includes receiving at an LDPC decoder data from a storage medium corresponding to N variable nodes. The method further includes: updating a subset of the N variable nodes; updating all check nodes logically coupled to the updated subset of the N variable nodes; and generating check node output data for each updated check node including at least an updated syndrome check. Finally, the method includes: stopping decoding of the read data in accordance with a determination that the syndrome checks for all the M check nodes are valid syndrome checks or initiating performance of the set of operations with respect to a next subset of the N variable nodes in accordance with a determination that the syndrome checks for all the M check nodes include one invalid syndrome check.


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