The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Dec. 19, 2011
Gang Shi, O'Fallon, MI (US);
Thomas E. Doane, Troy, MI (US);
Steven L. Kimbel, St. Charles, MI (US);
Robert H. Fuerhoff, St. Charles, MI (US);
Gang Shi, O'Fallon, MI (US);
Thomas E. Doane, Troy, MI (US);
Steven L. Kimbel, St. Charles, MI (US);
Robert H. Fuerhoff, St. Charles, MI (US);
MEMC Singapore Pte., Ltd., Singapore, SG;
Abstract
Methods and systems for evaluation of wafers are disclosed. One example method includes illuminating a multi-crystalline wafer according to a plurality of lighting parameters, capturing a plurality of images of the multi-crystalline wafer, stacking and projecting the plurality of images to generate a composite image, analyzing the composite image to identify one or more grains of the multi-crystalline wafer, and generating a report based on the analysis of the composite image. The multi-crystalline wafer is illuminated according to a different one of the plurality of lighting parameters in at least two of the plurality of images.