The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

May. 25, 2011
Applicants:

Kye Hyun Baek, Suwon-si, KR;

Sangwuk Park, Osan-si, KR;

Geum Jung Seong, Seoul, KR;

Yongjin Kim, Suwon-si, KR;

Inventors:

Kye Hyun Baek, Suwon-si, KR;

Sangwuk Park, Osan-si, KR;

Geum Jung Seong, Seoul, KR;

Yongjin Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G05B 23/02 (2006.01); H01L 21/3065 (2006.01); G05B 17/02 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01L 21/3065 (2013.01); G05B 17/02 (2013.01); H01J 37/3288 (2013.01); H01J 37/3299 (2013.01); H01J 37/32853 (2013.01); H01J 37/32981 (2013.01);
Abstract

Disclosed is an apparatus for processing a semiconductor and a method for generating a seasoning process of a reaction chamber. The method may include generating plasma in the reaction chamber using a production process recipe, obtaining at least one reference measurement value related to a byproduct of the generated plasma, performing a plurality of seasoning tests on the chamber to obtain a plurality of test results, generating an empirical model by forming at least one relational expression correlating variables manipulated during the performing of the plurality of seasoning tests to the plurality of test results, and estimating a seasoning process by using the at least one relational expression to estimate at least one estimated calculation value.


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