The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Sep. 30, 2013
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventor:

Asanga H. Perera, West Lake Hills, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 21/28 (2006.01); H01L 27/115 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28273 (2013.01); H01L 27/11531 (2013.01); H01L 29/66825 (2013.01); H01L 21/28282 (2013.01); H01L 27/11573 (2013.01);
Abstract

A method of making a semiconductor structure uses a substrate and includes a logic device in a logic region and a non-volatile memory (NVM) device in an NVM region. An NVM structure is formed in the NVM region. The NVM structure includes a control gate structure and a select gate structure. A protective layer is formed over the NVM structure. A gate dielectric layer is formed over the substrate in the logic region. The gate dielectric layer includes a high-k dielectric. A sacrificial gate is formed over the gate dielectric layer in the logic region. A first dielectric layer is formed around the sacrificial gate. Chemical mechanical polishing is performed on the NVM region and the logic region after forming the first dielectric layer. The sacrificial gate is replaced with a metal gate structure.


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