The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Oct. 18, 2012
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Roger Giles, Manchester, GB;
Matthew Clive Gill, Manchester, GB;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A time of flight analyzer that comprises a pulsed ion source; a non-linear ion mirror having a turn-around point; and a detector. The pulsed ion source is configured to produce an ion pulse travelling along an ion flight axis, the ion pulse comprising an ion group consisting of ions of a single m/z value, the ion group having a lateral spread. The non-linear ion mirror is configured to reflect the ion group, at the turn-around point, along the ion flight axis towards the detector, the passage of the ion group through the non-linear ion mirror causing a spatial spread of the ion group. The time of flight mass analyzer has at least one lens positioned between the ion source and the ion mirror, wherein the or each lens is configured to reduce said lateral spread so as to provide a local minimum of lateral spread within the ion mirror.