The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Mar. 12, 2014
International Business Machines Corporation, Armonk, NY (US);
Luiz C. Alves, Hopewell Junction, NY (US);
William J. Clarke, Poughkeepsie, NY (US);
Christopher R. Conklin, Stone Ridge, NY (US);
William V. Huott, Holmes, NY (US);
Kevin W. Kark, Poughkeepsie, NY (US);
Thomas J. Knips, Wappingers Falls, NY (US);
K. Paul Muller, Wappingers Falls, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments relate to built-in testing of an unused element on a chip. An aspect includes concurrently performing on a chip comprising a plurality of chip elements comprising a plurality of active elements, each active element enabled to perform a respective function, and at least one unused element that is disabled from performing the respective function and configured to be selectively enabled as an active element, the respective functions of the respective active elements and a built-in self test (BIST) test of the at least one unused element. Another aspect includes inputting an input test pattern to the unused element. Another aspect includes receiving an output test pattern based on the input test pattern from the unused element. Another aspect includes comparing the input test pattern to the output test pattern. Another aspect includes determining whether the unused element passed or failed the testing based on the comparison.