The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Apr. 30, 2012
Applicants:

Lian Fang, Irvine, CA (US);

Show Tien Wang, Huntington Beach, CA (US);

Feng Yu, Irvine, CA (US);

Inventors:

Lian Fang, Irvine, CA (US);

Show Tien Wang, Huntington Beach, CA (US);

Feng Yu, Irvine, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06T 11/20 (2006.01); G06T 17/30 (2006.01);
U.S. Cl.
CPC ...
G06T 11/203 (2013.01); G06T 17/30 (2013.01);
Abstract

Product data management systems, methods, and mediums. A method includes receiving a graphic model having a plurality of curves forming a curve chain and defining a distance threshold and angle threshold corresponding to the model. The method includes optimizing the curve chain under shape constraints, identifying a surface associated with the curve chain and optimizing the curve chain with under surface and distance constraints with respect to the identified surface. The method includes storing the graphic model with the optimized curve chain.


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