The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Apr. 04, 2012
Jiahua Fan, New Berlin, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Naveen Chandra, Waukesha, WI (US);
Suresh Narayanan Narayanan, Pewaukee, WI (US);
Dan Xu, Aurora, IL (US);
Jiahua Fan, New Berlin, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Naveen Chandra, Waukesha, WI (US);
Suresh Narayanan Narayanan, Pewaukee, WI (US);
Dan Xu, Aurora, IL (US);
General Electric Company, Schenectady, NY (US);
Abstract
A CT system includes a gantry, an x-ray source, a detector, and a grating collimator that includes alternating first and second materials. The system includes a controller configured to emit a first beam of x-rays from a first focal spot and to a first detector pixel, wherein the first beam of x-rays passes along a ray and through one of the first materials of the grating collimator, and subsequently emit a second beam of x-rays from a second focal spot and to the first detector pixel, wherein the second beam of x-rays passes substantially along the ray and through one of the second materials of the grating collimator. The system includes a computer programmed to generate first and second kVp image datasets using data acquired from the first beam and second beams of x-rays, and reconstruct a basis material image of the object.