The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Jun. 17, 2010
Anne M. Neubauer, Denver, CO (US);
Michael Grass, Buchholz in der Nordheide, DE;
John D. Carroll, Littleton, CO (US);
Shiuh-yung J. Chen, Englewood, CO (US);
Anne M. Neubauer, Denver, CO (US);
Michael Grass, Buchholz in der Nordheide, DE;
John D. Carroll, Littleton, CO (US);
Shiuh-Yung J. Chen, Englewood, CO (US);
Koninklijke Philips N.V., Eindhoven, NL;
The Regents of the University of Colorado, a body corporate, Denver, CO (US);
Abstract
It is described a method for spatially characterizing a device positioned within an object, e.g. a patient's body, under examination that e.g. allows a clinician to easily assess the deployment state and position of the device. The method comprises the steps of acquiring () a set of images of the device, reconstructing () a three-dimensional model of the device from the set of images, comparing () the model of the device with an ideal model of the device in a predetermined deployment state inside the object and displaying () the model of the device on a display unit. For optical indication deviation areas of the deployed device relative to an ideal model of the deployed device can be determined and color-coded depending on the strength of deviation.