The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Apr. 24, 2012
Applicants:

Naotsugu Sagawa, Tokyo, JP;

Kotaro Yano, Tokyo, JP;

Satoshi Yashiro, Yokohama, JP;

Inventors:

Naotsugu Sagawa, Tokyo, JP;

Kotaro Yano, Tokyo, JP;

Satoshi Yashiro, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01); G06K 9/6277 (2013.01);
Abstract

A recognition apparatus includes a calculation unit configured to calculate likelihood of each feature quantity based on the weighted distribution of the feature quantity extracted from a plurality of learning images, a correction unit configured, if a ratio of a learning image to a specific feature quantity is equal to or smaller than a predetermined ratio and a weight for the specific feature quantity is greater than a predetermined value, to correct the value of likelihood of the specific feature quantity to lower the value based on the distribution, a setting unit configured to set the likelihood corrected by the correction unit in association with a feature quantity, and a discrimination unit to extract a feature quantity from an input image and discriminate whether the input image includes a predetermined object based on the likelihood associated with the feature quantity.


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