The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Dec. 20, 2012
Emc Corporation, Hopkinton, MA (US);
Guangxin Yang, Beijing, CN;
Yi Ren, Beijing, CN;
Jianwang Ao, Beijing, CN;
Caleb E. Welton, Foster City, CA (US);
EMC CORPORATION, Hopkinton, MA (US);
Abstract
A method, article of manufacture, and apparatus for process data. In some embodiments, this includes determining a dataset, wherein the dataset includes a plurality of data values and a plurality of identifiers, and wherein the plurality of identifiers are in a non-continuous order, and wherein the dataset is stored across a number of segments, determining a number of samples to take from the dataset, identifying a minimum identifier and a maximum identifier, and a total number of identifiers, calculating a density based on the plurality of identifiers, minimum identifier and maximum identifier, calculating a number of samples to take from a segment based on the calculated density, the number of samples to take from the dataset, and the number of segments, generating a sub-dataset based on the calculated number of samples to take from a segment, joining the generated sub-dataset with the dataset, and storing the joined dataset in a storage device.