The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Jan. 11, 2013
Matthew W. Brocker, Gilbert, AZ (US);
Steven E. Cornelius, Gilbert, AZ (US);
Thomas E. Tkacik, Phoenix, AZ (US);
Matthew W. Brocker, Gilbert, AZ (US);
Steven E. Cornelius, Gilbert, AZ (US);
Thomas E. Tkacik, Phoenix, AZ (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method and apparatus for testing operation of a random number generator (RNG) testing circuit are provided. In accordance with at least one embodiment, a first RNG output value obtained from a RNG is stored in a first register. In response to activation of a test mode to simulate a faulty RNG, the first RNG output value is stored in a second register. The first RNG output value in the first register is compared to the first RNG output value in the second register. In response to the comparing, a RNG failure signal is provided at a RNG testing circuit output of the RNG testing circuit. In accordance with at least one embodiment, sequential and combinational logic can simulate a faulty RNG. Accordingly, simulation of a faulty RNG may be performed to test a RNG testing circuit even when the RNG is not faulty.