The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Jul. 01, 2011
Applicants:

Takashi Yamamoto, Tokyo, JP;

Gakuho Fukushi, Tokyo, JP;

Yoshihiro Wakita, Tokyo, JP;

Seiji Miyama, Kanagawa, JP;

Mana Miyakoshi, Tokyo, JP;

Inventors:

Takashi Yamamoto, Tokyo, JP;

Gakuho Fukushi, Tokyo, JP;

Yoshihiro Wakita, Tokyo, JP;

Seiji Miyama, Kanagawa, JP;

Mana Miyakoshi, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 27/0075 (2013.01);
Abstract

In one example embodiment, a microscope control device a controller configured to store a plurality of images having different depth positions. In one example embodiment, the microscope control device divides the plurality of images into a plurality of sub-regions. In one example embodiment, the microscope control device, for each sub-region, generates in-focus position information which corresponds to a depth position.


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Yamamoto, Takashi. (2015). Microscope control device, image display device, image management server, in-focus position information generating method, image display method, image management method and microscope image management system (U.S. Patent No. 9134524). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9134524

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