The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Feb. 18, 2011
Applicants:

Jean Seydoux, Rio de Janeiro, BR;

Dzevat Omeragic, Lexington, MA (US);

Dean M. Homan, Sugar Land, TX (US);

Inventors:

Jean Seydoux, Rio de Janeiro, BR;

Dzevat Omeragic, Lexington, MA (US);

Dean M. Homan, Sugar Land, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01V 3/22 (2006.01); G01V 3/30 (2006.01); G01V 1/52 (2006.01);
U.S. Cl.
CPC ...
G01V 3/22 (2013.01); G01V 1/52 (2013.01); G01V 3/30 (2013.01);
Abstract

The present disclosure relates to a method to determine a formation property of a subsurface formation. A downhole logging tool having two or more antennas, at least two of the antennas having a transversely-sensitive element and an axially-sensitive element is provided. Azimuthally-sensitive measurements are obtained using the antennas of the downhole logging tool. The measurements are fitted to a Fourier series having Fourier coefficients that include channel gains, if any. A DC component, a first harmonic component, and a second harmonic component are determined from the Fourier series, a measurement type is determined using the DC component, the first harmonic component, and/or the second harmonic component, and the formation property of the subsurface formation is determined using the determined measurement type.


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