The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Mar. 26, 2008
Tetsuro Mizuta, Kyoto, JP;
Keishi Kitamura, Kyoto, JP;
Yuichi Inaoka, Kyoto, JP;
Munehiro Takahashi, Kyoto, JP;
Michio Senda, Kobe, JP;
Keiichi Matsumoto, Kobe, JP;
Keiji Shimizu, Kobe, JP;
Tetsuro Mizuta, Kyoto, JP;
Keishi Kitamura, Kyoto, JP;
Yuichi Inaoka, Kyoto, JP;
Munehiro Takahashi, Kyoto, JP;
Michio Senda, Kobe, JP;
Keiichi Matsumoto, Kobe, JP;
Keiji Shimizu, Kobe, JP;
SHIMADZU CORPORATION, Kyoto, JP;
FOUNDATION FOR BIOMEDICAL RESEARCH AND INNOVATION, Hyogo, JP;
Abstract
A cross-sectional area calculation section calculates a cross-sectional area of a subject as physical quantity with respect to a size of the subject, and an NEC calculation section calculates a noise equivalent count NEC as physical quantity for evaluating an image. The C-NEC calculation section calculates a noise equivalent count per unit area C-NEC as physical quantity for evaluating an image as per size of the subject in accordance with the cross-sectional area of the subject calculated in the cross-sectional area calculation section and the noise equivalent count NEC calculated in the NEC calculation section. Accordingly, the noise equivalent count per unit area C-NEC is calculated as noted above, whereby an index may be determined that is independent of the cross-sectional area of the subject in evaluating the image.