The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Jun. 28, 2010
Applicants:

Alain Bergeron, Chemin Saint-Louis, CA;

Linda Marchese, Côte de Cap-Rouge, CA;

Inventors:

Alain Bergeron, Chemin Saint-Louis, CA;

Linda Marchese, Côte de Cap-Rouge, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9005 (2013.01); G01S 13/9035 (2013.01);
Abstract

There is described a method for determining a Doppler centroid in a synthetic aperture imaging system, comprising: receiving raw data representative of electromagnetic signals reflected by a target area; selecting, among the raw data, at least two sets of sub-area data each representative of electromagnetic signals reflected by a corresponding sub-area of the target area, the sub-areas being substantially aligned along an azimuth axis of the target area and having a substantially identical surface area; for each one of the sets of sub-area data, generating an image corresponding to the corresponding sub-area; and measuring a mean intensity of the image; and estimating the Doppler centroid from a skew of an intensity function representing the mean intensity as a function of a look number for the corresponding sub-area.


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