The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Mar. 07, 2012
Applicants:

Juxiang Ren, Austin, TX (US);

Chris C. Dao, Pflugerville, TX (US);

Stefano Pietri, Austin, TX (US);

Inventors:

Juxiang Ren, Austin, TX (US);

Chris C. Dao, Pflugerville, TX (US);

Stefano Pietri, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 35/00 (2006.01); G01R 31/3163 (2006.01); G01R 31/3167 (2006.01);
U.S. Cl.
CPC ...
G01R 35/00 (2013.01); G01R 31/3163 (2013.01); G01R 31/3167 (2013.01);
Abstract

An integrated circuit facilitates a self test routine that verifies proper operation of an analog comparator. In response to entering the self test routine, the voltage provided to an input of a comparator is changed from being at an operating voltage supply to being at a self test voltage that is used to verify operation of the comparator. In response to the comparator operating properly, the self test voltage provided to the input of the comparator is replaced with the operating voltage supply, and normal operation resumes. The duration of the self test cycle is based upon the amount of time during which the self test voltage is provided to the comparator is asynchronous in nature, and therefore not a function of a clock signal.


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