The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Mar. 06, 2009
Applicants:

Yuichi Hamada, Kobe, JP;

Daigo Fukuma, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Inventors:

Yuichi Hamada, Kobe, JP;

Daigo Fukuma, Kobe, JP;

Masaharu Shibata, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); Y10T 436/114165 (2015.01);
Abstract

An analyzer comprising: a first measurement unit for measuring samples; a second measurement unit for measuring samples; a transportation device for transporting samples to the first measurement unit and the second measurement unit; prior sample measurement instructor for instructing to measure a predetermined sample prior to the other samples; and a transportation controller for controlling the transportation device to reserve the transportation of the other samples to the second measurement unit and to perform the other transportation operation, when the prior sample measurement instructor has instructed to measure the predetermined sample by the second measurement unit prior to the other samples, is disclosed. A sample transportation method and a computer program product are also disclosed.


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