The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Sep. 28, 2012
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Nader G. Dariavach, Middleboro, MA (US);
Jin Liang, Southborough, MA (US);
Francis W. French, Harvard, MA (US);
Paul T. Callahan, Acton, MA (US);
Gordon O. Barr, Fall River, MA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G01N 27/02 (2006.01); G01N 27/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/00 (2013.01);
Abstract
A multi-channel contaminant sensor includes a first contamination test platform including an exposed first base metal portion that react in a first manner when exposed to one or more airborne contaminates. A second contamination test platform includes an exposed second base metal portion that reacts in a second manner when exposed to the one or more airborne contaminants.