The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Jul. 06, 2012
Applicants:
Samit Basu, Fremont, CA (US);
Todd Jason Gable, Newark, CA (US);
Inventors:
Samit Basu, Fremont, CA (US);
Todd Jason Gable, Newark, CA (US);
Assignee:
Morpho Detection, LLC, Newark, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/52 (2006.01); G01N 23/04 (2006.01); G06T 7/00 (2006.01); G01N 23/16 (2006.01); G01N 23/083 (2006.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 7/0004 (2013.01); G01N 23/083 (2013.01); G01N 23/16 (2013.01); G01N 2223/419 (2013.01); G01V 5/005 (2013.01); G06K 9/52 (2013.01); G06K 2209/09 (2013.01); G06T 2207/30112 (2013.01);
Abstract
A method for imaging an object is provided. The method includes acquiring image data of the object, wherein the image data includes a plurality of original voxels, and identifying, using a processing device, a first subset of voxels from the acquired image data. The method also includes performing a principal component analysis (PCA) on the first subset of voxels and determining whether sheet-like material is present in the object based on the results of the performed PCA on the first subset of voxels.