The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Apr. 23, 2010
Applicants:

Etienne Shaffer, Lausanne, CH;

Christian Depeursinge, Préverenges, CH;

Inventors:

Etienne Shaffer, Lausanne, CH;

Christian Depeursinge, Préverenges, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/021 (2006.01); G01N 21/64 (2006.01); G01B 11/00 (2006.01); G01B 11/24 (2006.01); G02B 21/08 (2006.01); G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01B 11/002 (2013.01); G01B 11/2441 (2013.01); G02B 21/086 (2013.01); G02B 21/14 (2013.01);
Abstract

The present invention discloses a method and its associated apparatus to retrieve the amplitude and, especially, the phase of nonlinear electromagnetic waves. The application field of the present invention is optical imaging. A sample is probed by coherent electromagnetic radiation, and by a nonlinear interaction such as harmonic generation a nonlinear object wave is emitted. A nonlinear reference wave is generated by interaction of the same nature with the coherent electromagnetic radiation, and an interference between the nonlinear object wave and the nonlinear reference wave is sensed by a detector array. As an example, the technique makes possible real-time nanometric localization and tracking of nonlinear field emitters, such as, but not limited to, nanoparticles.


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