The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Sep. 22, 2010
Frédéric Lesage, Montréal, CA;
Samuel Bélanger, St-Bruno, CA;
Maxime Abran, Montréal, CA;
Jean Provost, Brossard, CA;
Frédéric Lesage, Montréal, CA;
Samuel Bélanger, St-Bruno, CA;
Maxime Abran, Montréal, CA;
Jean Provost, Brossard, CA;
POLYVALOR, LIMITED PARTNERSHIP, Montreal, QC, CA;
Abstract
A system and method for optical data acquisition of an illuminated turbid medium object, the system comprises a variable structured light detector and a controller. The light detector is adapted to retrieve light from a plurality of detection points of an output surface of the illuminated turbid medium object with a plurality of detection patterns. The controller is adapted to control the variable structured light detector for the variable structured light detector to use a detection pattern corresponding to an illumination pattern of the illuminated turbid medium object. The light detector is further adapted to optically measure a combination of retrieved light from the plurality of detection points as an optical measurement. The controller is further adapted to store an illumination pattern identifier indicative of the illumination pattern, a detection pattern identifier indicative of the detection pattern and the corresponding optical measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile