The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Aug. 30, 2013
Exfo Inc., Quebec, CA;
Mario L'Heureux, Saint-Nicolas, CA;
Michel Leclerc, Quebec, CA;
Eric Thomassin, Quebec, CA;
Stephane Perron, Ste-Hélène-de-Breakeyville, CA;
EXFO Inc., Quebec, CA;
Abstract
There is provided a bi-directional optical reflectometric method for characterizing an optical fiber link. The method comprises: performing a plurality of forward-direction light acquisitions from one end of the optical fiber link and performing a plurality of backward-direction light acquisitions from the opposite end, wherein each light acquisition is performed by propagating at least one test light signal corresponding to given spatial resolution and detecting corresponding return light so as to obtain a reflectometric trace representing backscattered and reflected light as a function of a distance on the optical fiber link, and wherein said plurality of forward-direction light acquisitions and said plurality of backward-direction light acquisitions are each performed with mutually different spatial resolutions; and deriving a value of at least one parameter characterizing an event along said optical fiber link at least using a forward-direction light acquisition and a backward-direction light acquisition performed with mutually different spatial resolutions.