The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Feb. 21, 2012
Applicant:
Mikito Nakajima, Ina, JP;
Inventor:
Mikito Nakajima, Ina, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/02 (2006.01); G01J 1/42 (2006.01); G03B 27/80 (2006.01);
U.S. Cl.
CPC ...
G01J 1/4228 (2013.01); G01J 1/0228 (2013.01); G01J 1/429 (2013.01); G03B 27/80 (2013.01);
Abstract
A radiation failure inspecting method includes acquiring read data when a scanner reads a radiation surface of a radiation unit in a state where a reading surface of the scanner faces the radiation surface of the radiation unit and the radiation unit emits light; acquiring a value corresponding to a radiation energy of the light from the radiation unit by integrating the read data in a direction corresponding to a predetermined direction on the read data; and determining that a radiation failure occurs in the radiation unit when the value corresponding to the radiation energy of the light is equal to or less than a threshold value.