The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Aug. 02, 2012
Michael Kirst, Lorrach, DE;
Alfred Rieder, Landshut, DE;
Wolfgang Drahm, Erding, DE;
Hao Zhu, Freising, DE;
Christof Huber, Bern, CH;
Vivek Kumar, Allschwil, CH;
Michael Kirst, Lorrach, DE;
Alfred Rieder, Landshut, DE;
Wolfgang Drahm, Erding, DE;
Hao Zhu, Freising, DE;
Christof Huber, Bern, CH;
Vivek Kumar, Allschwil, CH;
Endress + Hauser Flowtec AG, Reinach, CH;
Abstract
A method for detecting accretion or abrasion on a first measuring tube of a flow measuring device. A first temperature as a function of time is registered via a first temperature sensor, which is arranged on the first measuring tube in such a manner that, between the first temperature sensor and the medium, at least one measuring tube wall of the first measuring tube is embodied. Parallel in time, a second reference temperature as a function of time is registered by a second temperature sensor, which is spaced from the first temperature sensor and thermally coupled to the medium. Therefrom, at least one variable characteristic is determined, and accretion or abrasion on the first measuring tube is detected, if the at least one determined characteristic variable or a variable derived therefrom deviates by more than a limit value from a predetermined reference variable.