The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Jul. 18, 2011
Applicants:

Scott E. Moore, Elk River, MN (US);

Brett Olin, Lewiston, ID (US);

Inventors:

Scott E. Moore, Elk River, MN (US);

Brett Olin, Lewiston, ID (US);

Assignee:

Vista Outdoor Operations LLC, Clearfield, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/02 (2006.01); G01B 7/02 (2006.01); G01B 11/02 (2006.01); G01B 13/02 (2006.01); G01B 21/02 (2006.01); G01F 23/292 (2006.01); F42B 33/02 (2006.01); G01F 25/00 (2006.01);
U.S. Cl.
CPC ...
G01F 23/292 (2013.01); F42B 33/0285 (2013.01); G01F 25/0061 (2013.01);
Abstract

A non-contacting deviation measurement system projects a first line and a second line upon a surface of an object. The projections of the first line and second line are arranged to overlap at an intersection line oriented at a nominal location such that when the surface is oriented at the nominal location, the intersection line appears on the surface. As the location of the surface deviates from the nominal location, the first line and second line as projected upon the surface move away from one another. The distance between the lines may be used to calculate the deviation from the nominal location. The deviation calculated may be compared to a predetermined maximum allowable deviation.


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