The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Feb. 04, 2014
Applicant:

Trimble Navigation Limited, Sunnyvale, CA (US);

Inventors:

Omar Pierre Soubra, Westminster, CO (US);

James M. Janky, Los Altos, CA (US);

Christian Graesser, Vallentuna, SE;

Shawn D. Weisenburger, Denver, CO (US);

Assignee:

Trimble Navigation Limited, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/00 (2006.01); G01C 15/00 (2006.01); G01C 15/06 (2006.01); G01S 19/48 (2010.01); G01S 19/51 (2010.01); G01S 19/53 (2010.01); G01S 1/72 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2006.01); G01C 9/06 (2006.01);
U.S. Cl.
CPC ...
G01C 15/00 (2013.01); G01C 9/06 (2013.01); G01C 15/06 (2013.01); G01S 1/725 (2013.01); G01S 19/48 (2013.01); G01S 19/51 (2013.01); G01S 19/53 (2013.01); G06K 9/00664 (2013.01); G06T 7/0042 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30244 (2013.01);
Abstract

A method of determining a tilt angle and a tilt direction of a survey instrument. The survey instrument has an imaging device that captures first images at a first location. The first images include features from an environment around the survey instrument. The imaging device also captures second images at a second location. The second images include a portion of the features. A pose of the imaging device is determined at the second location using observed changes in location of a common portion of the features between the first images and the second images. The tilt angle and the tilt direction of the survey instrument at the second location are determined using the pose of the imaging device.


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