The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
May. 22, 2012
Huijuan Luo, Guangdong, CN;
Guanyu Ji, Guangdong, CN;
Hui Jiang, Guangdong, CN;
Mingzhi Wu, Guangdong, CN;
Jihua Sun, Guangdong, CN;
Renhua Wu, Guangdong, CN;
Junwen Wang, Guangdong, CN;
Fei Gao, Guangdong, CN;
Huijuan Luo, Guangdong, CN;
Guanyu Ji, Guangdong, CN;
Hui Jiang, Guangdong, CN;
Mingzhi Wu, Guangdong, CN;
Jihua Sun, Guangdong, CN;
Renhua Wu, Guangdong, CN;
Junwen Wang, Guangdong, CN;
Fei Gao, Guangdong, CN;
BGI TECH SOLUTIONS CO., LTD., Shenzhen, CN;
Abstract
Provided is a high throughput methylation detection method, particularly a combined sequence capture and bisulfite sequencing method. The method accurately and effectively analyzes the methylation status of the target area in several samples simultaneously, lowers the difficulty of probe design, enhances operation and application feasibility, and enables high throughput methylation detection of high accuracy on interested target sequences and areas in a complete genome. The method is targeted and conserves energy and time.