The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
Oct. 27, 2014
Applicant:
Panasonic Corporation, Osaka, JP;
Inventors:
Motohiro Suzuki, Osaka, JP;
Hironobu Machida, Nara, JP;
Hiromu Saito, Tokyo, JP;
Tsubasa Hosoi, Kanagawa, JP;
Akira Yanagida, Saitama, JP;
Assignee:
PANASONIC CORPORATION, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08L 23/12 (2006.01); B29C 55/02 (2006.01); B29C 55/18 (2006.01); C08F 110/06 (2006.01); B29D 7/01 (2006.01); B29C 55/00 (2006.01); B29C 55/06 (2006.01); C08J 5/18 (2006.01); B29K 23/00 (2006.01); B29L 7/00 (2006.01);
U.S. Cl.
CPC ...
B29C 55/18 (2013.01); B29C 55/005 (2013.01); B29C 55/065 (2013.01); B29D 7/01 (2013.01); C08F 110/06 (2013.01); C08J 5/18 (2013.01); B29C 55/02 (2013.01); B29K 2023/12 (2013.01); B29L 2007/00 (2013.01); C08J 2323/12 (2013.01); C08L 23/12 (2013.01);
Abstract
A polypropylene molded article has a crystallinity degree of 48% or more by wide-angle X-ray diffraction measurement. The half width of an orientation peak in an azimuth angular distribution obtained by wide-angle X-ray diffraction measurement on the polypropylene molded article is 5.5° or less, and the long period of the polypropylene molded article obtained by small-angle X-ray scattering measurement is 12 nm or more and 16 nm or less.