The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Dec. 01, 2011
Applicants:

Frank Dennerlein, Forchheim, DE;

Ernst-peter Rührnschopf, Erlangen, DE;

Inventors:

Frank Dennerlein, Forchheim, DE;

Ernst-Peter Rührnschopf, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4007 (2013.01); A61B 6/032 (2013.01); A61B 6/4035 (2013.01); A61B 6/4233 (2013.01); A61B 6/482 (2013.01); G06T 11/005 (2013.01); A61B 6/03 (2013.01); A61B 6/4028 (2013.01); A61B 6/4441 (2013.01); G06T 2211/408 (2013.01);
Abstract

3D reconstructions can be calculated from grayscale X-ray images taken at different angular positions of an X-ray source and detector rotatable about a common axis. In the present case, X-ray radiation is applied to the object to be imaged such that one half of the X-ray detector receives radiation which differs in one characteristic from the radiation received by the second half of the detector via the object. A kind of dual-energy imaging can then be carried out in a single pass through the angular positions, enabling two 3D reconstructions to be generated simultaneously and then merged.


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