The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2015
Filed:
May. 13, 2010
Nobuhiro Tomatsu, Yokohama, JP;
Futoshi Hirose, Yokohama, JP;
Nobuhiro Tomatsu, Yokohama, JP;
Futoshi Hirose, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An imaging apparatus that irradiates an object with a first measuring beam and a second measuring beam that differ from each other in a center wavelength, and acquires an image of the object using returning light from the object. A first adjustment unit adjusts a focusing position of the first measuring beam in a depth direction. A second adjustment unit adjusts a focusing position of the second measuring beam in the depth direction. A controlling unit controls at least one of the first adjustment unit and the second adjustment unit such that the focusing position of the first measuring beam and the focusing position of the second measuring beam are at different positions in the depth direction.